DocumentCode :
2428610
Title :
Temperature-dependence electrical performance of GaAs-based HEMT-embedded accelerometer
Author :
Xue, Chenyang ; Tan, Zhenxin ; Hou, Tingting ; Liu, Guowen ; Liu, Jun ; Zhang, Binzhen
Author_Institution :
Dept. of Electron. Sci. & Technol., North Univ. of China, Taiyuan, China
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
798
Lastpage :
801
Abstract :
In this paper, it is researched that how I-V characteristics and piezoresistance coefficient of GaAs-based HEMT-embedded accelerometer change when different temperatures are set. It is shown that saturation current of device would go down if the temperature goes up, which is about 3.1467mA/°C, based on the research. However, the device can work well at the temperature range of -50°Cto 50°C, which indicates that it can work safely in the larger temperature range. Piezoresistance coefficient is also in down trend with the temperature rising, that it, it has negative temperature coefficient which is about 0.74%/°C, and it´s sensitivity is higher than Si.
Keywords :
III-V semiconductors; accelerometers; electric current measurement; gallium arsenide; high electron mobility transistors; piezoresistance; voltage measurement; GaAs; GaAs-based HEMT-embedded accelerometer; I-V characteristic; high electron mobility transistor; negative temperature coefficient; piezoresistance coefficient; saturation current; temperature -50 degC to 50 degC; temperature-dependence electrical performance; GaAs; HEMT; I-V characteristic; piezoresistive coefficient; temperature-dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5592281
Filename :
5592281
Link To Document :
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