DocumentCode :
2428971
Title :
Simulation studies and modeling of Short Circuit current oscillations in IGBTs
Author :
Milady, S. ; Silber, D. ; Pfirsch, F. ; Niedernostheide, F.-J.
Author_Institution :
Inst. for Electr. Drives, Power Electron. & Devices, Univ. of Bremen, Bremen, Germany
fYear :
2009
fDate :
14-18 June 2009
Firstpage :
37
Lastpage :
40
Abstract :
During Short-Circuit (SC) operations, strong current oscillations of IGBTs can appear. Simulation studies also confirm this. No parasitic inductances are required for such oscillations. A simplified equivalent circuit of the device, which is basically an RC oscillator, is able to reproduce the oscillations. The occurrence of oscillations depends on the model parameters, which can be related to the device structure and other conditions such as the gate resistance value, gate biasing, and DC-link voltage. This paper also shows that application of basic system theory methods to AC small-signal device simulation results (frequency-domain analysis under small-signal conditions) is appropriate to analyze the stability range of the IGBT under Short-Circuit.
Keywords :
RC circuits; equivalent circuits; inductance; insulated gate bipolar transistors; short-circuit currents; AC small-signal device simulation; DC-link voltage; IGBT; RC oscillator; current oscillations; device structure; equivalent circuit; frequency-domain analysis; gate biasing; gate resistance; parasitic inductances; short-circuit operations; Analytical models; Anodes; Cathodes; Circuit simulation; Frequency domain analysis; Insulated gate bipolar transistors; Roentgenium; Short circuit currents; Steady-state; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location :
Barcelona
ISSN :
1943-653X
Print_ISBN :
978-1-4244-3525-8
Electronic_ISBN :
1943-653X
Type :
conf
DOI :
10.1109/ISPSD.2009.5157995
Filename :
5157995
Link To Document :
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