DocumentCode
2429430
Title
Improvement of the RF power performance of nLDMOSFETs on bulk and SOI substrates with ‘ribbon’ gate and source contacts layouts
Author
Fournier, D. ; Ducatteau, D. ; Fontaine, J. ; Scheer, P. ; Bon, O. ; Rauber, B. ; Buczko, M. ; Gloria, D. ; Gaquière, C. ; Chevalier, P.
Author_Institution
STMicroelectronics, Crolles, France
fYear
2009
fDate
14-18 June 2009
Firstpage
116
Lastpage
119
Abstract
This paper presents the RF power performances of nLDMOSFETs fabricated on bulk and SOI substrates and the layout changes made to improve these performances. It is shown that simple design rules modifications can be done to increase fmax, by reducing the gate resistance, without penalizing fT. A significant improvement of both the output power Pout and the power added efficiency PAE is demonstrated in A and AB classes.
Keywords
MOSFET; microwave transistors; RF power performance; SOI substrates; Si; bulk substrates; gate resistance; nLDMOSFET; power added efficiency; ribbon gate; source contacts layouts; CMOS process; CMOS technology; Gallium arsenide; Immune system; MOSFETs; Power amplifiers; Radio frequency; Silicon on insulator technology; Switches; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location
Barcelona
ISSN
1943-653X
Print_ISBN
978-1-4244-3525-8
Electronic_ISBN
1943-653X
Type
conf
DOI
10.1109/ISPSD.2009.5158015
Filename
5158015
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