DocumentCode
2429729
Title
The 3.3kV Semi-SuperJunction IGBT for increased cosmic ray induced breakdown immunity
Author
Antoniou, Marina ; Udrea, Florin ; Bauer, Friedhelm
Author_Institution
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
fYear
2009
fDate
14-18 June 2009
Firstpage
168
Lastpage
171
Abstract
In this paper we propose and describe a new device, the 3.3 kV semi-superjunction insulated gate bipolar transistor (Semi SJ IGBT). The device offers significant improvement in the on-state and switching trade-off compared to both state-of the-art field stop (FS) trench IGBT and the Full SJ IGBT; There is no need for very deep pillars, therefore the ease of manufacturing is improved as the device can be based on the dasiapresentpsila CoolMOS type technology for formation of n & p pillars for 600-1 kV. This makes the device a potential winner for the 3.3 kV or even greater voltage ranges (e.g. 6.5 kV). Furthermore the device offers considerably better robustness against cosmic rays when compared to a conventional FS IGBT. Here we demonstrate via analytical modeling that the FIT (Failure in Time) levels can be improved by one to two orders of magnitude.
Keywords
insulated gate bipolar transistors; cosmic ray induced breakdown immunity; insulated gate bipolar transistor; superjunction; voltage 3.3 kV; voltage 6.5 kV; voltage 600 V to 1 kV; Breakdown voltage; Cosmic rays; Doping; Electric breakdown; Electrons; Insulated gate bipolar transistors; Manufacturing; Plasmas; Rails; Robustness; Cosmic Ray; IGBT; SuperJunction;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
Conference_Location
Barcelona
ISSN
1943-653X
Print_ISBN
978-1-4244-3525-8
Electronic_ISBN
1943-653X
Type
conf
DOI
10.1109/ISPSD.2009.5158028
Filename
5158028
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