• DocumentCode
    2429729
  • Title

    The 3.3kV Semi-SuperJunction IGBT for increased cosmic ray induced breakdown immunity

  • Author

    Antoniou, Marina ; Udrea, Florin ; Bauer, Friedhelm

  • Author_Institution
    Dept. of Eng., Univ. of Cambridge, Cambridge, UK
  • fYear
    2009
  • fDate
    14-18 June 2009
  • Firstpage
    168
  • Lastpage
    171
  • Abstract
    In this paper we propose and describe a new device, the 3.3 kV semi-superjunction insulated gate bipolar transistor (Semi SJ IGBT). The device offers significant improvement in the on-state and switching trade-off compared to both state-of the-art field stop (FS) trench IGBT and the Full SJ IGBT; There is no need for very deep pillars, therefore the ease of manufacturing is improved as the device can be based on the dasiapresentpsila CoolMOS type technology for formation of n & p pillars for 600-1 kV. This makes the device a potential winner for the 3.3 kV or even greater voltage ranges (e.g. 6.5 kV). Furthermore the device offers considerably better robustness against cosmic rays when compared to a conventional FS IGBT. Here we demonstrate via analytical modeling that the FIT (Failure in Time) levels can be improved by one to two orders of magnitude.
  • Keywords
    insulated gate bipolar transistors; cosmic ray induced breakdown immunity; insulated gate bipolar transistor; superjunction; voltage 3.3 kV; voltage 6.5 kV; voltage 600 V to 1 kV; Breakdown voltage; Cosmic rays; Doping; Electric breakdown; Electrons; Insulated gate bipolar transistors; Manufacturing; Plasmas; Rails; Robustness; Cosmic Ray; IGBT; SuperJunction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's, 2009. ISPSD 2009. 21st International Symposium on
  • Conference_Location
    Barcelona
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4244-3525-8
  • Electronic_ISBN
    1943-653X
  • Type

    conf

  • DOI
    10.1109/ISPSD.2009.5158028
  • Filename
    5158028