DocumentCode
2429776
Title
Automatic classification of amplitude, frequency, and phase shift keyed signals in the Wavelet Domain
Author
Ho, Ka Mun ; Vaz, Canute ; Daut, David G.
Author_Institution
Dept. of Electr. & Comput. Eng., State Univ. of New Jersey, Piscataway, NJ, USA
fYear
2010
fDate
12-14 April 2010
Firstpage
1
Lastpage
6
Abstract
In this study, automatic recognition of digitally modulated signals is investigated using the Continuous Wavelet Transform (CWT) in conjunction with techniques typically used in pattern recognition. In particular, the method of template matching is used. The templates used for the Automatic Modulation Recognition (AMR) process are determined based on the features, i.e., fractal patterns in the scalograms, of specific modulation schemes as they appear in the Wavelet Domain (WD). The digital modulation schemes considered include both binary and quaternary Amplitude (ASK) and Frequency Shift Keying (FSK), as well as M-ary Phase Shift Keying (MPSK) signals, where M=2, 4, and 8. The modulated signals used in this study have been corrupted by Additive White Gaussian Noise (AWGN) resulting in Signal-to-Noise Ratios (SNRs) in the range of -5 dB to 10 dB. Through the use of Monte Carlo computer simulations, it has been determined that the average overall correct classification rate for M-ary PSK signals was 99.1%; 98.9% for BASK and 4-ASK signals; and 90.4% for BFSK and 4-FSK signals over the range of SNR values.
Keywords
AWGN; Monte Carlo methods; amplitude shift keying; frequency shift keying; pattern recognition; phase shift keying; wavelet transforms; Monte Carlo computer simulations; additive white Gaussian noise; amplitude shift keyed signals; automatic classification; automatic recognition; continuous wavelet transform; frequency shift keyed signals; pattern recognition; phase shift keyed signals; template matching; wavelet domain; AWGN; Amplitude shift keying; Continuous wavelet transforms; Digital modulation; Fractals; Frequency shift keying; Pattern recognition; Phase shift keying; Wavelet domain; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Sarnoff Symposium, 2010 IEEE
Conference_Location
Princeton, NJ
Print_ISBN
978-1-4244-5592-8
Type
conf
DOI
10.1109/SARNOF.2010.5469784
Filename
5469784
Link To Document