DocumentCode
2430150
Title
Defect Characterization by Ultrasonic Signal Process Techniques
Author
Elsley, R.K. ; Tittman, B.R. ; Nadler, H.L. ; Ahlberg, L.A.
fYear
1977
fDate
1977
Firstpage
48
Lastpage
52
Keywords
Frequency dependence; Frequency estimation; Scattering; Shape; Signal processing; Signal processing algorithms; Size measurement; Stress; Transducers; Ultrasonic imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1977
Type
conf
DOI
10.1109/ULTSYM.1977.196791
Filename
1533731
Link To Document