DocumentCode :
2430150
Title :
Defect Characterization by Ultrasonic Signal Process Techniques
Author :
Elsley, R.K. ; Tittman, B.R. ; Nadler, H.L. ; Ahlberg, L.A.
fYear :
1977
fDate :
1977
Firstpage :
48
Lastpage :
52
Keywords :
Frequency dependence; Frequency estimation; Scattering; Shape; Signal processing; Signal processing algorithms; Size measurement; Stress; Transducers; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1977
Type :
conf
DOI :
10.1109/ULTSYM.1977.196791
Filename :
1533731
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2430150
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