Title :
Microstructural investigations of FeN and FeAlN thin films for recording head applications
Author :
Rogers, D.J. ; Wang, S. ; Laughlin, D.E. ; Kryder, M.H.
Author_Institution :
Carnegie Mellon University
Keywords :
Amorphous materials; Annealing; Crystallization; Grain size; Magnetic films; Magnetic heads; Magnetic properties; Nitrogen; Nonhomogeneous media; Transistors;
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
DOI :
10.1109/INTMAG.1992.696318
