Title :
An analysis of weight decay as a methodology of reducing three-layer feedforward artificial neural networks for classification problems
Author :
Chow, Mo-Yuen ; Teeter, Jason
Author_Institution :
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fDate :
27 Jun-2 Jul 1994
Abstract :
The structure of an artificial neural network chosen for a particular application can significantly affect the performance of the network. It is often advantageous or even necessary to choose the appropriate size for a network so that it will function more efficiently and/or provide greater insight into how the network learns the mapping. Weight decay is an attractive tool for reducing oversized networks to appropriate-sized ones. However, researchers have reported contrasting results for the methodology in the past. This paper examines the effectiveness of the conventional weight decay methodology as it applies to classification problems. Training parameters, stability and the effectiveness of the methodology are discussed and analyzed. XOR and AND are used as examples to illustrate the authors´ discussion. It is found that for these examples, weight decay can consistently minimize the number of hidden nodes used to learn the mappings with hyperbolic tangent activation functions. Ongoing tests with other binary mappings reveal that the methodology exhibits strong potential for use in more complex applications
Keywords :
feedforward neural nets; learning (artificial intelligence); pattern classification; transfer functions; AND; XOR; binary mappings; classification problems; hidden nodes; hyperbolic tangent activation functions; three-layer feedforward artificial neural networks; training parameters; weight decay; Application software; Artificial neural networks; Computer networks; Feedforward neural networks; Neural networks; Neurons; Performance analysis; Stability analysis; Testing; USA Councils;
Conference_Titel :
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-1901-X
DOI :
10.1109/ICNN.1994.374233