Title :
AIM-Lab: a system for remote characterization of electronic devices and circuits over the Internet
Author :
Fieldly, T.A. ; Shur, M.S. ; Shen, H. ; Ytterdal, T.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
We report on the development of AIM-Lab, a remotely operated laboratory for characterization of electronic devices and circuits over the Internet. Specifically, we apply the AIM-Lab concept in a senior/graduate semiconductor devices and circuits, which comes with a laboratory module that includes up to 9 experiments performed on a CMOS chip and a SiC diode. AIM-Lab has been used in the distance learning programs at Rensselaer Polytechnic Institute and at the Norwegian University of Science and Technology
Keywords :
Internet; computer aided instruction; distance learning; electronic engineering computing; electronic engineering education; laboratories; AIM-Lab; CMOS chip; Internet; SiC; SiC diode; distance learning; electronic circuit; electronic engineering education; remote laboratory; semiconductor device; Circuit simulation; Circuit testing; Computer science education; Instruments; Internet; Remote laboratories; Semiconductor devices; Semiconductor diodes; Silicon carbide; Web server;
Conference_Titel :
Devices, Circuits and Systems, 2000. Proceedings of the 2000 Third IEEE International Caracas Conference on
Conference_Location :
Cancun
Print_ISBN :
0-7803-5766-3
DOI :
10.1109/ICCDCS.2000.869858
