DocumentCode
2431013
Title
Arcing faults in low and medium voltage electrical systems - Why do they persist?
Author
Medora, Nosh K. ; Kusko, Alexander
Author_Institution
Exponent Failure Anal. Assoc., Inc., Phoenix, AZ, USA
fYear
2011
fDate
10-12 Oct. 2011
Firstpage
1
Lastpage
6
Abstract
Arcing faults can occur in low and medium voltage systems, causing high temperatures of the order of tens of thousands of degrees, resulting in severe damage to equipment and arc flash hazards with severe burns and possibly death. The electrical industry has adopted various codes and standards in an attempt to improve and enhance equipment safety, and decrease the possibility of the occurrence of arcing faults and thus mitigate the dangerous effects of arcing faults to humans. However, the NEC and other standards do not address the hazards associated when the equipment doors are open and a maintenance worker accidentally creates an arcing fault. Incidents of arcing faults that we have worked on were reviewed to determine the computed damaging effects of that fault, the degree of destruction, and specifically identify the root cause of that particular arcing fault. The objective of this paper is to review and investigate the reason for the large number of arcing faults in low and medium voltage electrical systems and further to determine why, there are so many arcing fault incidents in spite of increased levels of protection and installation of fail-safe mechanisms and procedures.
Keywords
arcs (electric); electrical safety; health hazards; NEC; arc flash hazards; arcing faults; electrical industry; equipment safety; fail-safe mechanisms; humans; installation; low voltage electrical systems; medium voltage electrical systems; Arc discharges; Circuit faults; Current transformers; Fault currents; Hazards; Metals; Power transformers; Arcing fault; arc; arc burns; arc flash; arc temperature; low voltage systems; medium voltage systems; short circuit current;
fLanguage
English
Publisher
ieee
Conference_Titel
Product Compliance Engineering (PSES), 2011 IEEE Symposium on
Conference_Location
San Diego, CA
Print_ISBN
978-1-61284-687-3
Type
conf
DOI
10.1109/PSES.2011.6088239
Filename
6088239
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