• DocumentCode
    2431240
  • Title

    Simulating quasi-ballistic transport in Si nanotransistors

  • Author

    Banoo, K. ; Jung-Hoon Rhew ; Lundstrom, M. ; Chi-Wang Shu ; Jerome, J.W.

  • Author_Institution
    EE Building, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2000
  • fDate
    22-25 May 2000
  • Firstpage
    8
  • Lastpage
    9
  • Abstract
    This paper will examine quasi-ballistic transport in a model nano-scale MOSFET using a full, numerical solution to the Boltzmann equation. We also critically assess standard transport models and show that they fail in the ballistic limit, where transistors are heading. We explain the underlying reasons for this failure and suggest an approach to developing a new class of transport models that work in both the ballistic and collision-dominated regimes.
  • Keywords
    Boltzmann equation; MOSFET; elemental semiconductors; nanotechnology; semiconductor device models; silicon; Boltzmann equation; Si; Si MOSFET; nanotransistor; numerical simulation; quasi-ballistic transport; Electrons; High definition video; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow 2000. 7th International Workshop on
  • Conference_Location
    Glasgow, UK
  • Print_ISBN
    0-85261-704-6
  • Type

    conf

  • DOI
    10.1109/IWCE.2000.869894
  • Filename
    869894