DocumentCode
2431240
Title
Simulating quasi-ballistic transport in Si nanotransistors
Author
Banoo, K. ; Jung-Hoon Rhew ; Lundstrom, M. ; Chi-Wang Shu ; Jerome, J.W.
Author_Institution
EE Building, Purdue Univ., West Lafayette, IN, USA
fYear
2000
fDate
22-25 May 2000
Firstpage
8
Lastpage
9
Abstract
This paper will examine quasi-ballistic transport in a model nano-scale MOSFET using a full, numerical solution to the Boltzmann equation. We also critically assess standard transport models and show that they fail in the ballistic limit, where transistors are heading. We explain the underlying reasons for this failure and suggest an approach to developing a new class of transport models that work in both the ballistic and collision-dominated regimes.
Keywords
Boltzmann equation; MOSFET; elemental semiconductors; nanotechnology; semiconductor device models; silicon; Boltzmann equation; Si; Si MOSFET; nanotransistor; numerical simulation; quasi-ballistic transport; Electrons; High definition video; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow 2000. 7th International Workshop on
Conference_Location
Glasgow, UK
Print_ISBN
0-85261-704-6
Type
conf
DOI
10.1109/IWCE.2000.869894
Filename
869894
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