DocumentCode :
2431269
Title :
The effect of low mobility sputter conditions on thin-film disk tribology
Author :
Schulz, K.J. ; Viswanathan, K.V. ; Wall, A.C. ; Bowen, A.J.
Author_Institution :
IBM Storage Systems Technology Division
fYear :
1992
fDate :
13-16 April 1992
Firstpage :
178
Lastpage :
178
Keywords :
Atomic force microscopy; Cascading style sheets; Chromium; Corrosion; Lubricants; Permeability measurement; Sputtering; Surface resistance; Testing; Tribology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1992. Digests of Intermag '92., International
Conference_Location :
St. Louis, MO, USA
Print_ISBN :
0-7803-0637-6
Type :
conf
DOI :
10.1109/INTMAG.1992.696361
Filename :
696361
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2431269
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