• DocumentCode
    2431438
  • Title

    Accurate modeling of light trapping in thin film silicon solar cells

  • Author

    Abouelsaood, A.A. ; Ghannam, M.Y. ; Poortmans, J. ; Mertens, R.P.

  • Author_Institution
    Phys. & Math. Dept., Cairo Univ., Egypt
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    An attempt is made to assess the accuracy of the simplifying assumption of total retransmission of light inside the “escape” or “loss” cone which is made in many models of optical confinement in thin-film silicon solar cells. A closed form expression is derived for the absorption enhancement factor as a function of the refractive index in the low-absorption limit for a thin-film cell with a flat front surface and a lambertian back reflector. Numerical calculations are carried out to investigate similar systems with antireflection coatings, and the investigation of cells with a textured front surface is achieved using a modified version of the existing ray tracing computer simulation program TEXTURE
  • Keywords
    antireflection coatings; electronic engineering computing; elemental semiconductors; ray tracing; semiconductor device models; semiconductor thin films; silicon; software packages; solar cells; Si; Si thin-film solar cells; TEXTURE; absorption enhancement factor; antireflection coatings; closed form expression; computer simulation; flat front surface; lambertian back reflector; light retransmission; light trapping modelling; low-absorption limit; optical confinement; ray tracing software; refractive index; textured front surface; Absorption; Coatings; Optical films; Optical refraction; Optical variables control; Photovoltaic cells; Refractive index; Semiconductor thin films; Silicon; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654059
  • Filename
    654059