DocumentCode :
2431438
Title :
Accurate modeling of light trapping in thin film silicon solar cells
Author :
Abouelsaood, A.A. ; Ghannam, M.Y. ; Poortmans, J. ; Mertens, R.P.
Author_Institution :
Phys. & Math. Dept., Cairo Univ., Egypt
fYear :
1997
fDate :
29 Sep-3 Oct 1997
Firstpage :
183
Lastpage :
186
Abstract :
An attempt is made to assess the accuracy of the simplifying assumption of total retransmission of light inside the “escape” or “loss” cone which is made in many models of optical confinement in thin-film silicon solar cells. A closed form expression is derived for the absorption enhancement factor as a function of the refractive index in the low-absorption limit for a thin-film cell with a flat front surface and a lambertian back reflector. Numerical calculations are carried out to investigate similar systems with antireflection coatings, and the investigation of cells with a textured front surface is achieved using a modified version of the existing ray tracing computer simulation program TEXTURE
Keywords :
antireflection coatings; electronic engineering computing; elemental semiconductors; ray tracing; semiconductor device models; semiconductor thin films; silicon; software packages; solar cells; Si; Si thin-film solar cells; TEXTURE; absorption enhancement factor; antireflection coatings; closed form expression; computer simulation; flat front surface; lambertian back reflector; light retransmission; light trapping modelling; low-absorption limit; optical confinement; ray tracing software; refractive index; textured front surface; Absorption; Coatings; Optical films; Optical refraction; Optical variables control; Photovoltaic cells; Refractive index; Semiconductor thin films; Silicon; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
ISSN :
0160-8371
Print_ISBN :
0-7803-3767-0
Type :
conf
DOI :
10.1109/PVSC.1997.654059
Filename :
654059
Link To Document :
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