Title :
A fast algorithm for the study of wave-packet scattering at disordered interfaces
Author :
Barker, J.R. ; Watling, J.R. ; Wilkins, R.
Author_Institution :
Dept. of Electron. & Electr. Eng., Glasgow Univ., UK
Abstract :
We describe a very efficient algorithm for determining the scattering of wave-packets in 2D and 3D off a rough interface. The immediate objective is to derive effective scattering rates for utilisation in Monte Carlo simulation of MOSFET devices. Our methodology involves solving the multi-dimensional time-dependent Schrodinger equation, based on two-time iteration and direct integration.
Keywords :
MOSFET; Monte Carlo methods; Schrodinger equation; integration; interface roughness; iterative methods; semiconductor device models; MOSFET devices; Monte Carlo simulation; direct integration; disordered interfaces; effective scattering rates; fast algorithm; multi-dimensional time-dependent Schrodinger equation; rough interface; two-time iteration; very efficient algorithm; wave-packet scattering; Finite difference methods; Germanium silicon alloys; MOSFET circuits; Rough surfaces; Scattering; Schrodinger equation; Semiconductor process modeling; Silicon germanium; Stability analysis; Surface roughness;
Conference_Titel :
Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow 2000. 7th International Workshop on
Conference_Location :
Glasgow, UK
Print_ISBN :
0-85261-704-6
DOI :
10.1109/IWCE.2000.869930
