DocumentCode :
24319
Title :
Analog Circuit Design Using Tunnel-FETs
Author :
Sedighi, Behnam ; Hu, Xiaobo Sharon ; Huichu Liu ; Nahas, Joseph J. ; Niemier, Michael
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Volume :
62
Issue :
1
fYear :
2015
fDate :
Jan. 2015
Firstpage :
39
Lastpage :
48
Abstract :
Tunnel-FET (TFET) is a major candidate for beyond-CMOS technologies. In this paper, the properties of the TFETs that affect analog circuit design are studied. To demonstrate how TFETs can enhance the performance or change the topology of the analog circuits, several building blocks such as operational transconductance amplifiers (OTAs), current mirrors, and track-and-hold circuits are examined. It is shown that TFETs are promising for low-power and low-voltage designs, wherein transistors are biased at low-to-moderate current densities. Comparing 14-nm III-V TFET-based OTAs with Si-MOSFET-based designs demonstrates up to 5 times reduction in the power dissipation of the amplifiers and more than an order of magnitude increase in their DC voltage gain. The challenges and opportunities that come with the special characteristics of TFETs, namely asymmetry, ambipolar behavior, negative differential resistance, and superlinear operation are discussed in detail.
Keywords :
CMOS integrated circuits; MOSFET; analogue circuits; current density; current mirrors; elemental semiconductors; field effect transistors; network synthesis; operational amplifiers; sample and hold circuits; silicon; tunnel transistors; CMOS technologies; III-V TFET-based OTA; Si; Si-MOSFET-based designs; ambipolar behavior; amplifier power dissipation; analog circuit design; current mirrors; low-to-moderate current densities; negative differential resistance; operational transconductance amplifiers; size 14 nm; superlinear operation; track-and-hold circuits; tunnel-FET; Analog circuits; CMOS integrated circuits; Capacitance; Logic gates; MOSFET; Transconductance; Amplifiers; analog circuits; benchmark testing; nanoscale devices; sampled-data circuits; tunneling devices;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2014.2342371
Filename :
6876225
Link To Document :
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