• DocumentCode
    2432058
  • Title

    CdTe1-xSx absorber layers for thin-film CdTe/CdS solar cells

  • Author

    McCandless, Brian E. ; Birkmire, Robert W.

  • Author_Institution
    Inst. of Energy Conversion, Delaware Univ., Newark, DE, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    307
  • Lastpage
    312
  • Abstract
    Fabrication of high efficiency superstrate CdTe/CdS solar cells results in diffusion of CdS into the CdTe layer. Control of this diffusion is critical for processing cells with ultra-thin CdS layers. Two approaches are presented for retarding the diffusion of CdS into the CdTe-based absorber layer during chloride treatment of superstrate thin-film CdTe/CdS solar cells. One approach utilizes as-deposited CdTe 1-xSx alloy absorber layers with x near the thermodynamic limit of CdS-CdTe alloys to reduce the driving force for CdS diffusion. The second approach employs an anneal at T>550°C prior to chloride heat treatment to reduce diffusion pathways near the absorber-window layer interface. X-ray diffraction, optical, and quantum efficiency measurements were used to quantify changes in CdS thickness and absorber layer composition
  • Keywords
    II-VI semiconductors; X-ray diffraction; annealing; cadmium compounds; diffusion; solar cells; CdS diffusion; CdTe-CdS; CdTe1-xSx absorber layers; CdTeS; X-ray diffraction; absorber-window layer interface; annealing; chloride treatment; diffusion pathways reduction; high efficiency superstrate solar cells; optical efficiency measurement; quantum efficiency measurement; thermodynamic limit; thin-film CdTe/CdS solar cells; ultra-thin CdS layers; Annealing; Fabrication; Heat treatment; Optical diffraction; Photovoltaic cells; Thermal force; Thermodynamics; Thickness measurement; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654090
  • Filename
    654090