• DocumentCode
    2432064
  • Title

    Vibration analysis of pMUT with polymer adhesion layer

  • Author

    Yaacob, Mohd Ikhwan Hadi ; Arshad, Mohd Rizal ; Manaf, Asrulnizam Abd ; Rahman, Mohamad Faizal Abd

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. Sains Malaysia Eng. Campus, Nibong Tebal, Malaysia
  • fYear
    2011
  • fDate
    28-30 Sept. 2011
  • Firstpage
    52
  • Lastpage
    55
  • Abstract
    Wafer bonding using polymer adhesive layer has gained many attentions for various MEMS applications. Numerous techniques and processes that utilize polymer adhesive have been established recently, mainly for wafer bonding and device packaging. However, adhesive layer contribution in vibrating micro structure such as micro ultrasonic transducer requires further investigations. This paper reports performance difference of piezoelectric micro ultrasonic transducer (pMUT) with polymer adhesion layer of PDMS, Cytop and Polyimide. Finite element analysis was utilized to analyze structure behavior during vibration. Frequency analysis revealed 41 kHz shift in device´s resonant frequency when different type of polymers employed as adhesive layer. Further investigations through piezoelectric analysis found that PDMS has contributed in 40% decrease of voltage response than other two polymers at only 6×10-5 μm/V, but carry the highest stress response at 2×10-5 μm/Pa in both transmit and receive modes in mechanical analysis. Finally, same analysis cycle was conducted on pMUT structure with polymer adhesive layer being replaced by polysilicon at the same thickness.
  • Keywords
    adhesion; finite element analysis; micromechanical devices; piezoelectric transducers; stress analysis; ultrasonic transducers; vibrations; wafer bonding; Cytop; MEMS applications; PDMS; device packaging; device resonant frequency; finite element analysis; frequency analysis; mechanical analysis; microstructure vibration; pMUT structure; piezoelectric analysis; piezoelectric microultrasonic transducer; polyimide; polymer adhesion layer; polysilicon; stress response; structure behavior; vibration analysis; voltage response; wafer bonding; Adhesives; Polyimides; Resonant frequency; Vibrations; Wafer bonding; Adhesive; Piezoelectric; Polymer; Ultrasonic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
  • Conference_Location
    Kota Kinabalu
  • Print_ISBN
    978-1-61284-844-0
  • Type

    conf

  • DOI
    10.1109/RSM.2011.6088290
  • Filename
    6088290