Title :
Numerical analysis on ZnxCd1−xS/CdTe solar cells with different buffer layers, front and back contacts
Author :
Hossain, Md Sharafat ; Aliyu, M.M. ; Matin, M.A. ; Razykov, T. ; Sopian, K. ; Amin, Nowshad
Author_Institution :
Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi, Malaysia
Abstract :
In this work, a numerical analysis on cadmium stannate (Cd2SnO4) as front contact, zinc stannate (Zn2SnO4) as buffer layer and antimony telluride (Sb2Te3) with molybdenum (Mo) as back contact has been conducted in the conventional (SnO2/CdS/CdTe/Ag) CdTe cell structures. Here, CdS window layer is replaced by zinc cadmium sulphide (ZnxCd1-xS) aiming to improve efficiency and stability utilizing Analysis of Microelectronic and Photonic Structures (AMPS 1D) simulator. Efficiency as high as 17.0% has been found with 80 nm of ZnxCd1-xS window layer for x=0.1, 1 μm of CdTe layer and 100 nm Zn2SnO4 buffer layer without Sb2Te3 back contact. However, ZnO insertion shows lower conversion efficiencies of 11.84% and 14.26%, respectively with and without Sb2Te3 back contact. It has been found that 1 μm of CdTe absorber layer, 70 nm of ZnxCd1-xS (x=0.1) window layer, 100 nm of Zn2SnO4 buffer layer and 100 nm Sb2Te3 back contact layer are sufficient for high efficiency (>;18.5%) ZnxCd1-xS/CdTe cells. Moreover, it has been found that the cell normalized efficiency linearly decreases with the increasing operating temperature at the temperature gradient of -0.3%/°C proving its stability as others.
Keywords :
antimony compounds; cadmium compounds; molybdenum; numerical analysis; solar cells; tin compounds; zinc compounds; AMPS 1D; Cd2SnO4; Mo; Sb2Te3; SnO2-CdS-CdTe-Ag; Zn2SnO4; ZnxCd1-xS-CdTe; absorber layer; back contacts; buffer layers; front contacts; microelectronic structures; numerical analysis; photonic structures; size 100 nm; size 70 nm; size 80 nm; solar cells; Buffer layers; Electric fields; Photonic band gap; Photovoltaic cells; Zinc oxide; AMPS-1D; CdTe; ZnxCd1−xS; buffer layer;
Conference_Titel :
Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
Conference_Location :
Kota Kinabalu
Print_ISBN :
978-1-61284-844-0
DOI :
10.1109/RSM.2011.6088292