A Method for Deembedding Mixed-Mode Power and Reflection Coefficient Measurements

Author

Rodríguez, Alberto ; Dunleavy, Lawrence

Author_Institution

Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL

fYear

2006

fDate

4-5 Dec. 2006

Firstpage

1

Lastpage

5

Abstract

The required S-parameter matrix formulations for deembedding single-ended measurement data to a mixed-mode device-under-test (DUT) measurement plane are presented. The necessary matrix equations for use with measured data given for components having a combination of single-ended as well as mixed-mode ports, and an example procedure for obtaining the matrices is given. The intended corrections presented in this work are for differential power and reflection coefficient measurements made at single-ended reference planes.

Keywords

S-matrix theory; S-parameters; differentiating circuits; integrated circuit measurement; integrated circuit testing; microwave integrated circuits; multiport networks; S-parameter matrix formulations; deembedding single-ended measurement; differential power measurement; mixed-mode device-under-test measurement; reflection coefficient measurement; single-ended reference planes; Electric variables measurement; Equations; Fixtures; Impedance measurement; Microwave devices; Microwave measurements; Power measurement; Reflection; Scattering parameters; Transmission line matrix methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Wireless and Microwave Technology Conference, 2006. WAMICON '06. IEEE Annual

Conference_Location

Clearwater Beach, FL

Print_ISBN

1-4244-0848-2

Electronic_ISBN

1-4244-0849-0

Type

conf

DOI

10.1109/WAMICON.2006.351968

Filename

4161130