DocumentCode
2432130
Title
Mechanical design and analysis of innovative integrated circuit test socket
Author
Ehtiatkar, Zahra ; Basiri, Salman ; Amin, Nowshad
Author_Institution
Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Bangi, Malaysia
fYear
2011
fDate
28-30 Sept. 2011
Firstpage
65
Lastpage
69
Abstract
Mechanical design and analysis of innovative test socket is done in this study by using ANSYS as Finite Element Analysis (FEA) software. It is designed to solve the problems brought to the IC leads by pogo pins in the IC testing process. Proposed test socket is formed as an array of holes filled with electrical conductive cells. Each cell consists of three different parts, including micro-contactors, polymer house and liquid metal. Liquid metal is used to absorb the pressure and prevent damaging to the IC leads. Mechanical and electrical analysis was done on the different models with 4, 8, 12, 16 and 20 micro-contactors. The 16 pin model showed the best results. This model was analyzed with different height and the results indicate that the 5mm height electrical conductive cell has the best characteristics. In optimization process, the 16 pin model with 5 mm height was optimized by changing the polymer house material and copper thickness. The enhancement was over 50 percents in some cases such as stress, strain and deformation. Stress and strain analysis shows that all of models have better results with many novelties to be commercially viable.
Keywords
deformation; electronic engineering computing; finite element analysis; integrated circuit design; integrated circuit testing; optimisation; ANSYS; FEA software; IC testing process; copper thickness; deformation; electrical analysis; electrical conductive cells; finite element analysis software; innovative integrated circuit test socket analysis; liquid metal; mechanical design; microcontactors; polymer house; size 5 mm; strain analysis; stress analysis; Conductivity; Contactors; Materials; Metals; Pins; Strain; Stress; Finite Element Analysis; Pogo Pin; Test Socket;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
Conference_Location
Kota Kinabalu
Print_ISBN
978-1-61284-844-0
Type
conf
DOI
10.1109/RSM.2011.6088293
Filename
6088293
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