DocumentCode :
2432245
Title :
Step height evaluation in the vibrating condition based on microscopic interferometry
Author :
Bian, Yan ; Guo, Tong
Author_Institution :
Dept. of Autom. Eng., Tianjin Univ. of Technol. & Educ., Tianjin, China
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
528
Lastpage :
531
Abstract :
Microscopic interferometry can be applied in the step height evaluation with sub-nanometer vertical resolution. This paper describes the effect of outside vibration on the evaluation process through many experiments. A micro actuator with high accuracy is used as the simulation of outside vibration. Experiments are done on the system with different vibration amplitudes, vibration frequencies and phase extracting algorithms. The experimental results show that different phase extracting algorithms have different responses to the outside vibration; low frequency has a strong effect on the measurement values when the vibration amplitude is below a threshold value; however, the effect on the step height evaluation is small by averaging many profiles.
Keywords :
height measurement; image resolution; microactuators; phase shifting interferometry; vibrations; micro actuator; microscopic interferometry; outside vibration effect; phase extracting algorithm; step height evaluation; sub-nanometer vertical resolution; Step height; microscopic interferometry; phase extracting algorithm; vibrating condition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5592453
Filename :
5592453
Link To Document :
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