Title :
CMOS Op amp testing for capacitive measuring systems application
Author :
Arfah, Nurul ; Alam, A. H M Zahirul ; Khan, Sheroz
Author_Institution :
Dept. of Electr. & Comput. Eng., Int. Islamic Univ. Malaysia, Gombak, Malaysia
Abstract :
Operational amplifier (Op amp) is the most integral part of an embedded circuit building block. In this paper, the testing of an integrated Op amp suitable use for capacitance and high speed measuring system has been made. The Op amp testing (such as large signal differential transfer characteristic, frequency respond analysis, input common mode analysis, slew rate analysis) has been done using the PSpice OrCAD Version 16.0 circuit simulator and simulation results were compared with the design specification. The design of this Op amp for capacitive measuring system is making use of 0.13 μm complementary metal-oxide-semiconductor (CMOS) technology. This high speed and low power consumption system design is suitable use in a measuring system for detection a wide and lower range of capacitance.
Keywords :
CMOS integrated circuits; capacitance measurement; circuit simulation; integrated circuit design; low-power electronics; operational amplifiers; CMOS op amp testing; PSpice OrCAD Version 16.0 circuit simulator; capacitive measuring systems application; complementary metal-oxide-semiconductor technology; design specification; embedded circuit building block; frequency respond analysis; high speed measuring system; input common mode analysis; large signal differential transfer characteristic; low power consumption system design; operational amplifier; size 0.13 mum; slew rate analysis; CMOS integrated circuits; Capacitance; Capacitance measurement; Operational amplifiers; Simulation; Transistors; Voltage measurement; CMOS Integrated Circuit; capacitance measuring systems; operational amplifier;
Conference_Titel :
Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
Conference_Location :
Kota Kinabalu
Print_ISBN :
978-1-61284-844-0
DOI :
10.1109/RSM.2011.6088318
