Title :
Efficient reconfiguration of WSI arrays
Author :
Bhatia, Dinesh ; Leighton, Tom ; Makedon, Fillia
Author_Institution :
Dept. of Comput. Sci., Texas Univ., Richardson, TX, USA
Abstract :
A new technique for efficient reconfiguration of large VLSI arrays suitable for wafer-scale integration (WSI) is introduced. Under the common assumption of uniformly distributed faults, the VLSI arrays are reconstructed in polynomial time using a matching technique first introduced by F.T. Leighton and P.W. Shor (1986). In addition, a randomized method for reducing the maximum wire length and the total wire length is developed and it is shown experimentally that the technique performs better than previous methods
Keywords :
VLSI; computer architecture; configuration management; VLSI arrays; WSI arrays; efficient reconfiguration; large VLSI arrays; matching technique; maximum wire length; polynomial time; randomized method; total wire length; uniformly distributed faults; wafer-scale integration; Aging; Assembly systems; Computer science; Contracts; Laboratories; Polynomials; Silicon; Very large scale integration; Wafer scale integration; Wire;
Conference_Titel :
Systems Integration, 1990. Systems Integration '90., Proceedings of the First International Conference on
Conference_Location :
Morristown, NJ
Print_ISBN :
0-8186-9027-5
DOI :
10.1109/ICSI.1990.138661
