Title :
Studies of recrystallization of CdTe thin films after CdCl2 treatment [solar cells]
Author :
Moutinho, H.R. ; Al-Jassim, M.M. ; Abulfotuh, F.A. ; Levi, D.H. ; Dippo, P.C. ; Dhere, R.G. ; Kazmerski, L.L.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fDate :
29 Sep-3 Oct 1997
Abstract :
CdTe thin film solar cells deposited by physical vapor deposition (PVD) and close-spaced sublimation (CSS) have been treated with CdCl2 at 350° and 400°C. Atomic force microscopy (AFM) analysis showed that the films started recrystallizing during the 350°C CdCl2 treatment. These results were confirmed by the presence of two lattice parameters, detected using X-ray diffraction (XRD) analysis. The PVD films treated at 400°C were completely recrystallized and grain growth was observed. The formation of Cd(S1-xTex) alloy in these films was evidenced by the appearance of extra peaks close to the CdTe peaks in the diffraction patterns. No major changes were observed in the structural properties of CSS CdTe films treated at the same conditions. It was concluded that the effect of the CdCl2 treatment in the CdTe films is to promote recrystallization and grain growth, but only if enough lattice-strain energy is available (as is the case for PVD films). Time-resolved photoluminescence (TRPL) analysis showed, for PVD and CSS films, an increase in minority-carrier lifetime with the treatment, mainly at 400°C, probably due to elimination of deep levels within the band gap
Keywords :
II-VI semiconductors; X-ray diffraction; atomic force microscopy; cadmium compounds; carrier lifetime; energy gap; minority carriers; recrystallisation; semiconductor thin films; solar cells; sublimation; vapour deposited coatings; vapour deposition; 350 C; 400 C; CdCl2; CdTe; CdTe thin-film solar cells; X-ray diffraction; atomic force microscopy; band gap; close-spaced sublimation; deep levels elimination; grain growth; lattice parameters; lattice-strain energy; minority-carrier lifetime; physical vapor deposition; post CdCl2 treatment; recrystallization behaviour; structural properties; time-resolved photoluminescence; Atherosclerosis; Atomic force microscopy; Atomic layer deposition; Cascading style sheets; Chemical vapor deposition; Lattices; Photovoltaic cells; Sputtering; Transistors; X-ray detection;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654120