Title :
An efficient diagnosis march-based algorithm for coupling faults in SRAM
Author :
Hasan, W.Z.W. ; Halin, I. ; Shafie, Suhaidi ; Othman, M.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Putra Malaysia, Serdang, Malaysia
Abstract :
This paper presents an applying of march test algorithms to diagnose coupling faults (CFs) of SRAMs memories. Two phases of test algorithm is used to identify all the CFs. At Phase 1 march Cd is used to detect and diagnosis partially of the CFs. The March Distinguish Algorithm (MDA) is used in phase 2 to identify the identical fault syndromes which cannot be identified by the march Cd. Therefore, the proposed test algorithms which (13N + 3N/4N) read/write operations for a bit-oriented SRAM can achieve full diagnose.
Keywords :
SRAM chips; fault diagnosis; CF; MDA; bit-oriented SRAM; coupling faults; efficient diagnosis march-based algorithm; identical fault syndromes; march distinguish algorithm; semiconductor memory technologies; Algorithm design and analysis; Complexity theory; Computer architecture; Couplings; Fault diagnosis; Random access memory; Testing;
Conference_Titel :
Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
Conference_Location :
Kota Kinabalu
Print_ISBN :
978-1-61284-844-0
DOI :
10.1109/RSM.2011.6088323
