• DocumentCode
    2432955
  • Title

    ZnO(CdS)/CIS/Mo solar cells characterized by modulation capacitance voltage measurements

  • Author

    Sinh, Ngo Duong ; Scheer, R. ; Kliefoth, K. ; Fussel, W. ; Fuhs, W.

  • Author_Institution
    Hahn-Meitner-Inst., Berlin, Germany
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    467
  • Lastpage
    470
  • Abstract
    From modulation capacitance voltage (MCV) measurements we determined a voltage Vs of several hundred mV at the depletion region in CuInS2 under PV generator and short circuit working conditions. In this solar cell type electron transport through shallow gap states in the CdS interlayer enhances interface recombination which increases the dark current. The CuInSe2 solar cells show a different behaviour. In darkness, electron emission into the depletion region over a barrier of more than 500 mV was measured, and voltage losses while working as PV generator remain nearly constant below 60 mV. We interpret these results by a blocking CuInS2/Mo contact and a band spike at the CdS/CuInSe2 junction
  • Keywords
    II-VI semiconductors; cadmium compounds; copper compounds; electron-hole recombination; indium compounds; molybdenum; p-n heterojunctions; semiconductor thin films; solar cells; ternary semiconductors; voltage measurement; zinc compounds; CdS interlayer; CdS/CuInSe2 junction; CuInS2; PV generator; ZnO(CdS)/CIS/Mo solar cells; ZnO(CdS)CuInSe2-Mo; band spike; blocking CuInS2/Mo contact; dark current; depletion region; electron emission; electron transport; interface recombination enhancement; modulation capacitance voltage measurements; shallow gap states; short circuit working; voltage losses; Capacitance measurement; Capacitance-voltage characteristics; Circuits; Computational Intelligence Society; Electrons; Employee welfare; Photovoltaic cells; Solar power generation; Spontaneous emission; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654129
  • Filename
    654129