Title :
The Keynote Address
Abstract :
Provides an abstract of the keynote presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Keywords :
BiCMOS integrated circuits; CMOS technology; Instruments; MOSFET circuits; National electric code; Random access memory; Threshold voltage;
Conference_Titel :
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-1908-7
DOI :
10.1109/IRWS.1994.515817
