Title :
Intelligent systems for reliability
Author :
Aboura, K. ; Singpurwalla, N.D. ; Soyer, R.
Author_Institution :
Inst. for Reliability & Risk Anal., George Washington Univ., Washington, DC, USA
Abstract :
The authors discuss the use of expert opinion in reliability assessment. They present an approach for the analysis of life-length data that can be described by a Weibull distribution. They address the problem of predicting the number of defects due to fatigue in a railroad track. In both cases, a Bayesian approach is taken and procedures are developed and implemented on a personal computer
Keywords :
Bayes methods; expert systems; reliability; Bayesian approach; Weibull distribution; engineering computing; fatigue defects prediction; life-length data; railroad track; reliability assessment; Aging; Bayesian methods; Intelligent systems; Microcomputers; Shape; Uncertainty; Weibull distribution;
Conference_Titel :
Intelligent Control, 1988. Proceedings., IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-8186-2012-9
DOI :
10.1109/ISIC.1988.65413
