• DocumentCode
    2433099
  • Title

    Current-voltage modeling of Bilayer Graphene Nanoribbon Schottky Diode

  • Author

    Rahmani, Meisam ; Ahmadi, Mohammad Taghi ; Shayesteh, Nahid ; Amin, Noraliah Aziziah ; Rahmani, Komeil ; Ismail, Razali

  • Author_Institution
    Dept. of Electron. Eng., Univ. Teknol. Malaysia (UTM), Skudai, Malaysia
  • fYear
    2011
  • fDate
    28-30 Sept. 2011
  • Firstpage
    256
  • Lastpage
    258
  • Abstract
    This paper is all about the current-voltage modeling of Bilayer Graphene Nanoribbons (BGNRs) Schottky Diode. The metal semiconductor devices were used in the beginning of the year 1900s. We can make a point contact diode by touching a metallic whisker to an exposed semi-conductor surface. The metal semiconductor diodes were replaced by the p-n junction in the 1950´s because they were not easily reproduced or found to be mechanically reliable. As a result the practicability of making use of the semiconductor and vacuum technology to construct reproducible and dependable metal semiconductor contacts. Therefore, a high consideration occurs for the schottky barrier diode or metal semiconductor rectifying contact. A model to evaluate or design the current-voltage (I-V) characteristics of BGNRs schottky diode as a function of physical parameters, such as GNR width (w), effective mass (m*), gate insulator thickness (tins), and electrical parameters, such as schottky barrier (SB) height (φSB) are presented in this paper.
  • Keywords
    Schottky barriers; Schottky diodes; graphene; nanoribbons; semiconductor device models; C; Schottky barrier diode; Schottky barrier height; bilayer graphene nanoribbon Schottky diode; current-voltage characteristics; current-voltage modeling; electrical parameters; gate insulator thickness; metal semiconductor contacts; metal semiconductor devices; metal semiconductor diodes; metal semiconductor rectifying contact; metallic whisker; p-n junction; point contact diode; semiconductor surface; vacuum technology; Current density; Logic gates; Metals; P-n junctions; Schottky barriers; Schottky diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
  • Conference_Location
    Kota Kinabalu
  • Print_ISBN
    978-1-61284-844-0
  • Type

    conf

  • DOI
    10.1109/RSM.2011.6088337
  • Filename
    6088337