DocumentCode :
2433263
Title :
Fabrication and performance analysis of an amorphous silicon-based thermal IR detector
Author :
Kang, Hyun Oh ; Zhiguo, Zhao ; Jeon, Seong Ki ; Jung, Ho ; Kim, Hak-Rin ; Kwon, Dae-Hyuk ; Lee, Jung-Hee ; Kang, Shin-Won ; Kong, Seong Ho
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
696
Lastpage :
699
Abstract :
In this paper, an amorphous Si-based thermal infrared detector with an improved responsivity and optimized structure is reported. Using Finite Element Analysis (FEA) simulation, the length and structure of the leg to extend sensing area are designed to minimize the heat loss of uncooled bolometric amorphous Si-based thermal infrared detector. The thermal infrared detector is fabricated using microelectro mechanical system (MEMS) technology and the operating performances of thermal infrared detector are analyzed and compared with conventional thermal infrared detectors.
Keywords :
amorphous semiconductors; finite element analysis; infrared detectors; microfabrication; silicon; MEMS technology; amorphous silicon-based thermal IR detector; finite element analysis; thermal infrared detector; amorphous silicon; s-bolometer; thermal image sensor; uncooled infrared detector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5592504
Filename :
5592504
Link To Document :
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