Title :
Fabrication and performance analysis of an amorphous silicon-based thermal IR detector
Author :
Kang, Hyun Oh ; Zhiguo, Zhao ; Jeon, Seong Ki ; Jung, Ho ; Kim, Hak-Rin ; Kwon, Dae-Hyuk ; Lee, Jung-Hee ; Kang, Shin-Won ; Kong, Seong Ho
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea
Abstract :
In this paper, an amorphous Si-based thermal infrared detector with an improved responsivity and optimized structure is reported. Using Finite Element Analysis (FEA) simulation, the length and structure of the leg to extend sensing area are designed to minimize the heat loss of uncooled bolometric amorphous Si-based thermal infrared detector. The thermal infrared detector is fabricated using microelectro mechanical system (MEMS) technology and the operating performances of thermal infrared detector are analyzed and compared with conventional thermal infrared detectors.
Keywords :
amorphous semiconductors; finite element analysis; infrared detectors; microfabrication; silicon; MEMS technology; amorphous silicon-based thermal IR detector; finite element analysis; thermal infrared detector; amorphous silicon; s-bolometer; thermal image sensor; uncooled infrared detector;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
DOI :
10.1109/NEMS.2010.5592504