Title :
Residue checker using optimal signed-digit adder tree for error detection of arithmetic circuits
Author_Institution :
Dept. of Mech. Sci. & Technol., Gunma Univ., Kiryu, Japan
Abstract :
In this paper, a new residue checker using optimal signed-digit (SD) adder tree structure is presented for the error detection of multiply-accumulate arithmetic circuit. The modulus of the redisue cheker is set to m = 2P + u, where n ϵ {- 1,1} and p is the word length of the residue checker. By switching u = 1 to/from u = - 1, more 2-bit errors can be detected using the same checking circuit. The fast modulo m SD adder with an end-around carry is introduced, so that the modulo m addition time is independent of the word length of operands of the residue checker, and the delay time of the proposed residue checker is dependent of the stages of the binary tree structure of the modulo m SD adders. When n is the word length of the operands of the multiply-accumulate circuit, we can obtain an optimal binary tree structure with the shortest path of SD adders, in which there are log2 n + log2(n/p) + l stages of SD adders. We also implement the residue checker circuts with different p for n = 32 and n = 64 and the best one is with p = 8 both in delay time and error detection.
Keywords :
adders; digital arithmetic; error detection; SD adder tree structure; arithmetic circuits; delay time; end-around carry; error detection; modulo m addition time; multiply-accumulate arithmetic circuit; optimal binary tree structure; optimal signed-digit adder tree; residue checker circuit; Adders; Binary trees; Complexity theory; Delays; Real-time systems; Switching circuits; Very large scale integration; SD adder tree; error detection; multiply-accumulate arithmetic; residue arithmetic; signed-digit (SD) number;
Conference_Titel :
TENCON 2014 - 2014 IEEE Region 10 Conference
Conference_Location :
Bangkok
Print_ISBN :
978-1-4799-4076-9
DOI :
10.1109/TENCON.2014.7022471