DocumentCode :
2433372
Title :
The morphology of CdS thin films deposited on SnO2-coated glass substrates [for solar cells]
Author :
Hasoon, F.S. ; Al-Jassim, M.M. ; Swartzlander, A. ; Sheldon, P. ; Al-Douri, A.A.J. ; Alnajjar, A.A.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
1997
fDate :
29 Sep-3 Oct 1997
Firstpage :
543
Lastpage :
546
Abstract :
The morphology and microstructure of cadmium sulfide (CdS) thin films are a major concern in the fabrication process of CdTe solar cells. In this work, we investigate the morphology and microstructure of chemical-bath-deposited CdS in order to better understand the growth conditions that give rise to films for optimum device performance. The film morphology was investigated by field-emission, high-resolution scanning electron microscopy (SEM). The film microstructure was studied by transmission electron microscopy (TEM), while the film´s chemistry was investigated by Auger electron spectroscopy (AES). All films examined exhibited pinholes and discontinuities varying in size and density. This may have a significant impact on cell performance by providing shunt paths between the CdTe and the SnO2. Additionally, the CdS films are heavily faulted, which may partially explain why a high density of planar defects is observed in the CdTe/CdS interface region
Keywords :
Auger effect; II-VI semiconductors; cadmium compounds; crystal defects; crystal microstructure; crystal morphology; scanning electron microscopy; semiconductor device testing; semiconductor growth; semiconductor thin films; solar cells; substrates; transmission electron microscopy; Auger electron spectroscopy; CdS thin films; CdS-CdTe; CdS-CdTe solar cells; SnO2; SnO2-coated glass substrates; chemical bath deposition; discontinuities; fabrication process; growth conditions; microstructure; morphology; optimum device performance; pinholes; planar defects; scanning electron microscopy; transmission electron microscopy; Cadmium compounds; Chemicals; Fabrication; Microstructure; Morphology; Photovoltaic cells; Scanning electron microscopy; Sputtering; Transistors; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
ISSN :
0160-8371
Print_ISBN :
0-7803-3767-0
Type :
conf
DOI :
10.1109/PVSC.1997.654148
Filename :
654148
Link To Document :
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