DocumentCode :
243370
Title :
Dynamic Random Testing with Parameter Adjustment
Author :
Zijiang Yang ; Beibei Yin ; Junpeng Lv ; Kaiyuan Cai ; Yau, Stephen S. ; Jia Yu
Author_Institution :
Dept. of Autom. Control, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
fYear :
2014
fDate :
21-25 July 2014
Firstpage :
37
Lastpage :
42
Abstract :
In order to improve traditional Random Partition Testing (RPT) strategy, Dynamic Random Testing (DRT) strategy is proposed. By DRT, testing profile is dynamically updated according to the previous test case execution result. The effectiveness of DRT depends on parameter settings. In this paper, a strategy is presented for extending the DRT with parameter adjustment in order to guarantee that the optimized boundaries. Using this strategy, the parameters in DRT are adjusted based on testing history during testing process. Case studies are presented and analyzed to show the improvement of DRT.
Keywords :
dynamic testing; program testing; DRT strategy; RPT strategy; dynamic random testing; parameter adjustment; random partition testing; software testing; test case execution; testing history; Aerodynamics; Flexible printed circuits; History; Parameter estimation; Software; Sufficient conditions; Testing; adjusted dynamic random testing; dynamic random testing; software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference Workshops (COMPSACW), 2014 IEEE 38th International
Conference_Location :
Vasteras
Type :
conf
DOI :
10.1109/COMPSACW.2014.10
Filename :
6903102
Link To Document :
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