• DocumentCode
    243370
  • Title

    Dynamic Random Testing with Parameter Adjustment

  • Author

    Zijiang Yang ; Beibei Yin ; Junpeng Lv ; Kaiyuan Cai ; Yau, Stephen S. ; Jia Yu

  • Author_Institution
    Dept. of Autom. Control, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • fYear
    2014
  • fDate
    21-25 July 2014
  • Firstpage
    37
  • Lastpage
    42
  • Abstract
    In order to improve traditional Random Partition Testing (RPT) strategy, Dynamic Random Testing (DRT) strategy is proposed. By DRT, testing profile is dynamically updated according to the previous test case execution result. The effectiveness of DRT depends on parameter settings. In this paper, a strategy is presented for extending the DRT with parameter adjustment in order to guarantee that the optimized boundaries. Using this strategy, the parameters in DRT are adjusted based on testing history during testing process. Case studies are presented and analyzed to show the improvement of DRT.
  • Keywords
    dynamic testing; program testing; DRT strategy; RPT strategy; dynamic random testing; parameter adjustment; random partition testing; software testing; test case execution; testing history; Aerodynamics; Flexible printed circuits; History; Parameter estimation; Software; Sufficient conditions; Testing; adjusted dynamic random testing; dynamic random testing; software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference Workshops (COMPSACW), 2014 IEEE 38th International
  • Conference_Location
    Vasteras
  • Type

    conf

  • DOI
    10.1109/COMPSACW.2014.10
  • Filename
    6903102