Title :
Transport analysis for polycrystalline silicon solar cells on glass substrates
Author :
Brendel, R. ; Bergmann, R.B. ; Fischer, B. ; Krinke, J. ; Plieninger, R. ; Rau, U. ; Reiß, D. ; Strunk, H.P. ; Wanka, H. ; Wernel, J.H.
Author_Institution :
Max-Planck-Inst. fur Festkorperforschung, Stuttgart, Germany
fDate :
29 Sep-3 Oct 1997
Abstract :
The authors fabricate polycrystalline silicon solar cells on glass by Si deposition on solid phase crystallized seed layers and derive an effective diffusion length Leff,QE=3 μm from quantum efficiency measurements. Three-dimensional transport modeling reveals that Leff,QE differs from the diffusion length Leff,IV in the diode saturation current jo=(q ni 2D)/(NA Leff,IV). Here q, ni, D, and NA denote the elementary charge, intrinsic carrier concentration, diffusion constant and doping concentration, respectively. However, the difference is small for their polycrystalline Si solar cells. Dominant recombination in the space charge region limits the open circuit voltage to 340 mV
Keywords :
carrier density; carrier lifetime; electron-hole recombination; elemental semiconductors; glass; semiconductor device models; semiconductor device testing; semiconductor doping; silicon; solar cells; space charge; substrates; 3 mum; 340 mV; Si; Si polycrystalline solar cells; deposition; diffusion constant; diode saturation current; dominant recombination; doping concentration; effective diffusion length; elementary charge; glass substrates; intrinsic carrier concentration; open circuit voltage; quantum efficiency measurements; solid phase crystallized seed layers; space charge region; three-dimensional transport modeling; transport analysis; Crystallization; Diodes; Doping; Glass; Length measurement; Phase measurement; Photovoltaic cells; Radiative recombination; Silicon; Solids;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654169