DocumentCode :
2434038
Title :
Combined Magnetic, Electric and Topographic Microscopy of Microfabricated Meter Lines-Quantification of MFM Force Response
Author :
Gomez, R.D. ; Anderson, Alexander J. ; Mayergoyz, Isaak D.
Author_Institution :
Univ. of Maryland
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
15
Lastpage :
15
Keywords :
Calibration; Electrostatics; Force measurement; Frequency; Magnetic field measurement; Magnetic force microscopy; Magnetic moments; Phase estimation; Phase measurement; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.735483
Filename :
735483
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2434038
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