Title :
An efficient algorithm for gate matrix compactions
Author :
Hou, Cliff Yungchin ; Chen, C. Y Roger
Author_Institution :
Dept. of Electr. & Comput. Eng., Syracuse Univ., NY, USA
Abstract :
The authors present an efficient algorithm to minimize the layout area by taking the physical sizes of each line, variable net spacing, contact offset, diffusion line offset, and metal line offset into consideration. This algorithm can be used as a postprocessing step for the gate matrix layout. Significant reduction in the layout area, compared to results without performing layout compaction, is achieved.<>
Keywords :
circuit layout CAD; contact offset; diffusion line offset; efficient algorithm; gate matrix compactions; layout area; metal line offset; minimisation; postprocessing step; variable net spacing; Circuits; Compaction; Contacts; Fabrication; Wires;
Conference_Titel :
Computers and Communications, 1989. Conference Proceedings., Eighth Annual International Phoenix Conference on
Conference_Location :
Scottsdale, AZ, USA
Print_ISBN :
0-8186-1918-x
DOI :
10.1109/PCCC.1989.37441