Analysis and optimization of high efficiency multijunction a-Si:H solar cells

Author

Rocheleau, Richard E. ; Tun, Moe ; Hegedus, Steven S.

Author_Institution

Sch. of Ocean & Earth Sci. & Technol., Hawaii Univ., Honolulu, HI, USA

fYear

1997

fDate

29 Sep-3 Oct 1997

Firstpage

703

Lastpage

706

Abstract

A phenomenological model for multijunction (MJ) a-Si solar cells which integrates a detailed optical model and an equivalent circuit model with voltage-dependent photocurrent was developed. The model has been used to analyze the performance of United Solar´s world record stabilized 13.0% efficient triple junction cell. Light-biased MJ quantum efficiency was analyzed to estimate nominal i-layer bandgaps and thickness. Component cell JV data were analyzed to determine a consistent set of i-layer and diode properties. Using the component cell parameters, close agreement was found between the measured and calculated MJ performance. The performance of this MJ cell is insensitive to small changes in the thickness of the i-layers but is sensitive to the μt of middle and bottom cells and small changes in bandgap. The model has been combined with a powerful multivariable optimization routine to identify requirements to reach 15% efficiency

Keywords

amorphous semiconductors; elemental semiconductors; equivalent circuits; hydrogen; optimisation; p-n heterojunctions; semiconductor device models; semiconductor doping; solar cells; 13 percent; Si:H; component cell parameters; equivalent circuit model; multijunction a-Si:H solar cells; multivariable optimization routine; nominal i-layer bandgaps; nominal i-layer thickness; optical model; phenomenological model; photovoltaic performance; quantum efficiency; triple junction cell; voltage-dependent photocurrent; Data analysis; Equivalent circuits; Integrated optics; Optical recording; Optical sensors; Performance analysis; Photoconductivity; Photonic band gap; Photovoltaic cells; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE

Conference_Location

Anaheim, CA

ISSN

0160-8371

Print_ISBN

0-7803-3767-0

Type

conf

DOI

10.1109/PVSC.1997.654186

Filename

654186