• DocumentCode
    2434281
  • Title

    Optical optimization of a-Si:H solar cells using planar junctions and diffuse rear reflectors

  • Author

    Winz, K. ; Fortmann, C.M. ; Eickhoff, Th. ; Wagner, H.

  • Author_Institution
    Div. Photovoltaics, Res. Center Julich GmbH, Germany
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    723
  • Lastpage
    726
  • Abstract
    Simple unoptimized planar junction amorphous silicon-based solar cells with TiO2 based diffuse rear reflectors can obtain i-layer absorption similar to that of solar cells prepared on high quality commercially available textured TCO substrates. Also, the naturally occurring surface roughness in amorphous and microcrystalline materials can be exploited to fabricate very effective diffuse rear reflectors. Accurate determination of surface roughness and film optical properties are required to fully probe the potential of diffuse reflection from naturally occurring surface roughness. However, the coupling of bulk optical parameters with surface roughness artifacts poses difficulties for accurate determination of film optical properties. A new technique was developed and implemented to characterize surface scattering
  • Keywords
    amorphous semiconductors; elemental semiconductors; hydrogen; optical properties; p-n junctions; semiconductor thin films; silicon; solar cells; surface scattering; surface topography; titanium compounds; Si:H; TiO2; TiO2 based diffuse rear reflectors; a-Si:H solar cells; bulk optical parameters coupling; diffuse rear reflectors; i-layer absorption; naturally occurring surface roughness; optical optimization; optical properties; planar junctions; solar cells; surface roughness; surface scattering; textured TCO substrates; Absorption; Amorphous materials; Optical films; Optical materials; Optical scattering; Photovoltaic cells; Probes; Rough surfaces; Substrates; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654191
  • Filename
    654191