A self-testing and self-pruning binary communication tree for a wafer scale database system

Author

Guilford, James ; Rogers, E.H.

Author_Institution

Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA

fYear

1989

fDate

3-5 Jan 1989

Firstpage

355

Lastpage

364

Abstract

The design of the internal node for the WaRP wafer-scale database machine is described. The WaRP architecture consists of a binary tree laid out on a wafer. Most of the data storage and processing occurs in the leaf nodes. The internal nodes of the tree are given the task of distributing queries to the leaves and combining responses. The tree is both fault tolerant and soft-prunable in the field; it is possible to both test the tree and to prune away faulty nodes. As a result, most of the internal node is concerned with testability

Keywords

VLSI; computer architecture; database management systems; fault tolerant computing; special purpose computers; trees (mathematics); WaRP; data storage; fault tolerant; faulty nodes; internal node; leaf nodes; queries; responses; self-pruning binary communication tree; soft-prunable; testability; wafer scale database system; Binary trees; Built-in self-test; Computer architecture; Computer science; Database systems; Fault tolerance; Memory; Performance evaluation; Routing; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Wafer Scale Integration, 1989. Proceedings., [1st] International Conference on

Conference_Location

San Francisco, CA

Print_ISBN

0-8186-9901-9

Type

conf

DOI

10.1109/WAFER.1989.47566

Filename

47566