• DocumentCode
    2434400
  • Title

    A model of temperature cycling performance in plastic encapsulated packages

  • Author

    Syndergaard, Paul ; Young, Jim

  • Author_Institution
    American Microsyst. Inc., Pocatello, ID, USA
  • fYear
    1994
  • fDate
    16-19 Oct 1994
  • Firstpage
    37
  • Lastpage
    41
  • Abstract
    A requirement for many customers of semiconductors encapsulated in plastic packages is the ability to survive 1000 cycles of air-to-air (gas-to-gas) temperature cycle under the conditions of -65°C to +150°C. A series of experiments were performed to model the performance of molding compounds relative to die size. The model was then correlated to the historical temperature cycling data of an encapsulant independent of package size or type. The temperature cycle performance can now be predicted based on die size. The package size or type is incidental, a larger package is generally required for a larger die
  • Keywords
    encapsulation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; plastic packaging; production testing; -65 to 150 degC; air-to-air temperature cycle; die size; model; molding compounds; plastic encapsulated packages; temperature cycling performance; Ambient intelligence; Application specific integrated circuits; Geometry; History; Neck; Passivation; Physics; Plastic packaging; Semiconductor device packaging; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop, 1994. Final Report., 1994 International
  • Conference_Location
    Lake Tahoe, CA
  • Print_ISBN
    0-7803-1908-7
  • Type

    conf

  • DOI
    10.1109/IRWS.1994.515824
  • Filename
    515824