DocumentCode
2434400
Title
A model of temperature cycling performance in plastic encapsulated packages
Author
Syndergaard, Paul ; Young, Jim
Author_Institution
American Microsyst. Inc., Pocatello, ID, USA
fYear
1994
fDate
16-19 Oct 1994
Firstpage
37
Lastpage
41
Abstract
A requirement for many customers of semiconductors encapsulated in plastic packages is the ability to survive 1000 cycles of air-to-air (gas-to-gas) temperature cycle under the conditions of -65°C to +150°C. A series of experiments were performed to model the performance of molding compounds relative to die size. The model was then correlated to the historical temperature cycling data of an encapsulant independent of package size or type. The temperature cycle performance can now be predicted based on die size. The package size or type is incidental, a larger package is generally required for a larger die
Keywords
encapsulation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; plastic packaging; production testing; -65 to 150 degC; air-to-air temperature cycle; die size; model; molding compounds; plastic encapsulated packages; temperature cycling performance; Ambient intelligence; Application specific integrated circuits; Geometry; History; Neck; Passivation; Physics; Plastic packaging; Semiconductor device packaging; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Conference_Location
Lake Tahoe, CA
Print_ISBN
0-7803-1908-7
Type
conf
DOI
10.1109/IRWS.1994.515824
Filename
515824
Link To Document