DocumentCode :
2434651
Title :
Soft X-Ray Resonant Magnetic Reflectivity Study of Thin Films and Multilayers
Author :
Tonnerre, J.M.
Author_Institution :
Laboratoire de Cristallographie, France
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
27
Lastpage :
27
Keywords :
Iron; Magnetic analysis; Magnetic field induced strain; Magnetic films; Magnetic moments; Magnetic multilayers; Magnetic resonance; Optical films; Reflectivity; Soft magnetic materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.735518
Filename :
735518
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2434651
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