DocumentCode :
2434673
Title :
Hard X-Ray Reflectivity on Thin Co Films
Author :
Lott, D. ; Kao, C.C. ; Hastings, J.B. ; Freeland, J.W.
Author_Institution :
NSLS, Brookhaven Natl. Lab., Upton, NY
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
28
Lastpage :
28
Keywords :
Brillouin scattering; Iron; Light scattering; Magnetic field measurement; Magnetic films; Magnetic resonance; Optical films; Optical scattering; Reflectivity; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.735519
Filename :
735519
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2434673
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