DocumentCode :
2434713
Title :
The precise measurement of phase noise of ultra-low-noise stable oscillators and frequency synthesizers under vibration and acoustic noise conditions
Author :
Sidko, V.I. ; Khitrovsky, V.A.
Author_Institution :
State Enterprise Orion, Kiev, Ukraine
fYear :
2000
fDate :
11-15 Sept. 2000
Firstpage :
540
Lastpage :
542
Abstract :
The instruments for measuring the ultra low phase noise of a high-speed multifunctional frequency synthesizer under vibration and acoustic noise conditions have been developed. In specified conditions the reliable results of measurement of the noise level of -107 dBc/Hz at the offset frequency of 1 kHz in X-band have been achieved.
Keywords :
acoustic noise; frequency stability; frequency synthesizers; microwave generation; microwave measurement; microwave oscillators; phase noise; X-band; acoustic noise conditions; offset frequency; phase noise; ultra-low-noise frequency synthesizers; ultra-low-noise stable oscillators; vibration conditions; Acoustic measurements; Acoustic noise; Frequency measurement; Frequency synthesizers; Instruments; Noise measurement; Oscillators; Phase measurement; Phase noise; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2000. Microwave and Telecommunication Technology. 2000 10th International Crimean
Conference_Location :
Crimea, Ukraine
Print_ISBN :
966-572-048-1
Type :
conf
DOI :
10.1109/CRMICO.2000.1256218
Filename :
1256218
Link To Document :
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