Title :
The development results of the microwave-based device for defect exposure in multi-layer fiberglass plastic structures, polymer and lacquer-and-paint coatings
Author :
Dzhala, V.R. ; Kempa, Ya.M. ; Lyashchuk, O.B. ; Naumets, N.A. ; Rybak, Ya.N. ; Tsukomyk, G.V.
Author_Institution :
Karpenko Phys.-Mech. Inst., Acad. of Sci., Lvov, Ukraine
Abstract :
Presents the development results of a device for defect exposure in flaky multi-layer fiber-glass plastic structures (e.g. airborne radomes) and polymeric and lacquer-and-paint protective coatings. A defects disclosure criterion is based on the analysis of amplitude and phase parameters of incident and reflected waves with the use of special algorithm in non-defect and defective materials. The range of working frequencies is 53...62 GHz. The device consists of two blocks: SHF sensor and microprocessor unit with LCD-indicator. Power supply: 220 V, 50 Gz (or 22...32 V DC), 8 W.
Keywords :
adhesion; glass fibre reinforced plastics; inverse problems; microwave devices; microwave measurement; nondestructive testing; protective coatings; radomes; 53 to 62 GHz; SHF sensor; airborne radomes; amplitude parameters; defect exposure; defective materials; defects disclosure criterion; lacquer-and-paint coatings; microprocessor unit; microwave-based device; multi-layer fiberglass plastic structures; phase parameters; polymer coatings; Algorithm design and analysis; Coatings; Frequency; Microprocessors; Microwave devices; Optical fiber devices; Plastics; Polymer films; Power supplies; Protection;
Conference_Titel :
Microwave Conference, 2000. Microwave and Telecommunication Technology. 2000 10th International Crimean
Conference_Location :
Crimea, Ukraine
Print_ISBN :
966-572-048-1
DOI :
10.1109/CRMICO.2000.1256239
