Title :
DEGRADATION OP OFF-STATE LEAKAGE IN PMOS TRANSISTORS UNDER HOT CARRIER INJECTION
Author :
Huang, Charles H J ; Rost, Timothy A. ; McPherson, Joe W.
Keywords :
Condition monitoring; Degradation; Electron traps; Hot carrier injection; Hot carriers; Leakage current; MOSFETs; Stress; Temperature dependence; Voltage;
Conference_Titel :
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Print_ISBN :
0-7803-1908-7
DOI :
10.1109/IRWS.1994.515828
