DocumentCode :
2435084
Title :
Simple sticking models and adhesion criterion to predict sticking effects of fixed-fixed beams in RF MEMS switch design
Author :
Hui, Yu ; Yang, Kai ; Jiao, Binbin ; Jing, Yupeng ; Chen, Dapeng
Author_Institution :
Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
fYear :
2010
fDate :
20-23 Jan. 2010
Firstpage :
997
Lastpage :
1001
Abstract :
The fixed-fixed beam in RF switches fabricated by MEMS techniques of a sacrificial layer is inclined to stick to the substrate due to the significant capillary force during drying process. In this paper, sticking models of the fixed-fixed beam are investigated to analyze the sticking effect. Based on these models, an adhesion criterion hc for the fixed-fixed beam is derived to determine whether the beam sticks to the substrate or not. The deduced formula shows that hc is determined by the material property of the beam and its length L and thickness t. It is also found that the width of the beam has no effect on hc. The theoretical models and adhesion criterion are simulated and verified by Finite Element Analysis. The effects of residual stress are also discussed to meet the uncertainty of real fabrication processes.
Keywords :
adhesion; drying; finite element analysis; internal stresses; microfabrication; microswitches; RF MEMS switch design; RF switches fabrication; adhesion criterion; drying process; finite element analysis; fixed-fixed beams; material property; residual stress; sacrificial layer; sticking effect prediction; MEMS; RF switch; fixed-fixed beam; sticking effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6543-9
Type :
conf
DOI :
10.1109/NEMS.2010.5592597
Filename :
5592597
Link To Document :
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