Electronic Speckle Pattern Interferom-etry for JWVST

Author

Saif, Babak ; Bluth, Marcel ; Eegholm, Bente ; Zukowski, Barbara ; Keski-Kuha, Ritva ; Blake, Peter

Author_Institution

Space Telescope Sci. Inst., Baltimore

fYear

2007

fDate

3-10 March 2007

Firstpage

1

Lastpage

10

Abstract

Development of many new technologies is required to successfully produce the large, lightweight, deployable, cryogenic telescope with segmented primary mirror for the James Webb Space Telescope (JWST) mission. One of the technologies is interferometry to verify structural deformations in large, deployable, lightweight, cryogenic, precision structures to nanometer level accuracy. An instantaneous acquisition phase shifting speckle interferometer was designed and built to support the development of JWST optical telescope element (OTE) primary mirror backplane. This paper discusses characterization of the electronic speckle pattern interferometer (SPS-DSPI) developed for JWST to verify its capability to measure structural deformations in large composite structures at cryogenic temperature.

Keywords

aerospace instrumentation; astronomical telescopes; electronic speckle pattern interferometry; infrared astronomy; James Webb Space Telescope; cryogenic temperature; electronic speckle pattern interferometry; instantaneous acquisition phase shifting speckle interferometer; structural deformations; Cryogenics; Mirrors; Nanostructures; Optical design; Optical interferometry; Phase shifting interferometry; Space missions; Space technology; Speckle; Telescopes;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace Conference, 2007 IEEE

Conference_Location

Big Sky, MT

ISSN

1095-323X

Print_ISBN

1-4244-0524-6

Electronic_ISBN

1095-323X

Type

conf

DOI

10.1109/AERO.2007.353007

Filename

4161426