Title :
Tearing techniques for symbolic simulation of large-scale analog circuits
Author :
Iordache, Marius ; Dumitriu, Lucia ; Constantinescu, Florin ; Nitescu, Miruna
Author_Institution :
Dept. of Electr. Eng., Politehnic Univ. of Bucharest, Romania
Abstract :
We present some new tearing techniques to systematically formulate the state equations in symbolic normal-form for linear and/or nonlinear time-invariant large-scale analog circuits with excess elements of both types. Degeneracies of the first and of the second kind are unitarily treated in order to allow a symbolic representation of the circuit with a minimum number of state variables and to identify the eigenvalues equal to zero. An illustrative example is given to prove that our program is a very useful tool for symbolic analysis and design of linear and/or nonlinear time-invariant large-scale analog circuits.
Keywords :
analogue integrated circuits; circuit simulation; eigenvalues and eigenfunctions; linear network analysis; nonlinear network analysis; symbol manipulation; eigenvalues; large-scale analog circuits; linear analog circuits; nonlinear analog circuits; state equations; state variables; symbolic analysis; symbolic design; symbolic normal-form; symbolic representation; symbolic simulation; tearing techniques; time-invariant analog circuits; Analog circuits; Analog computers; Capacitors; Circuit simulation; Eigenvalues and eigenfunctions; Inductors; Integrated circuit interconnections; Large-scale systems; Matrix decomposition; Nonlinear equations;
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
DOI :
10.1109/ICECS.2002.1046388