Title :
Design of a sigma-delta modulator in standard CMOS process for wide-temperature applications
Author :
Yucai Wang ; Chodavarapu, Vamsy P.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
We present a delta-sigma modulator in a standard CMOS process that is designed to operate over a wide temperature range from -55 oC to 225 oC. The circuit is implemented using IBM 0.13μm CMOS technology with 2.5V power supply. We applied constant-gm biasing technique and other design considerations to compensate performance degradation over temperature variation. Simulation results show that the modulator offers a minimum ENOB of 14 bits over the desired wide temperature range.
Keywords :
CMOS digital integrated circuits; logic design; sigma-delta modulation; thermal analysis; CMOS process; ENOB; IBM CMOS technology; biasing technique; effective number of bits; sigma-delta modulator; size 0.13 mum; temperature -55 degC to 225 degC; voltage 2.5 V; CMOS integrated circuits; CMOS technology; Modulation; Sigma-delta modulation; Temperature distribution; Temperature measurement; Temperature sensors; Analog to Digital Converter; CMOS; Wide-temperature; sensor interface circuits;
Conference_Titel :
Quality Electronic Design (ISQED), 2015 16th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-7580-8
DOI :
10.1109/ISQED.2015.7085408
