Title :
Robust fitting of ellipses and spheroids
Author :
Yu, Jieqi ; Kulkarni, Sanjeev R. ; Poor, H. Vincent
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., Princeton, NJ, USA
Abstract :
Ellipse and ellipsoid fitting has been extensively researched and widely applied. Although traditional fitting methods provide accurate estimation of ellipse parameters in the low-noise case, their performance is compromised when the noise level or the ellipse eccentricity are high. A series of robust fitting algorithms are proposed that perform well in high-noise, high-eccentricity ellipse/spheroid (a special class of ellipsoid) cases. The new algorithms are based on the geometric definition of an ellipse/spheroid, and improved using global statistical properties of the data. The efficacy of the new algorithms is demonstrated through simulations.
Keywords :
computational geometry; statistical analysis; surface fitting; ellipse fitting; ellipsoid fitting; robust fitting; statistical properties; Application software; Computer vision; Ellipsoids; Extraterrestrial measurements; Least squares methods; Noise level; Noise robustness; Parameter estimation; Pattern recognition; Solid modeling;
Conference_Titel :
Signals, Systems and Computers, 2009 Conference Record of the Forty-Third Asilomar Conference on
Conference_Location :
Pacific Grove, CA
Print_ISBN :
978-1-4244-5825-7
DOI :
10.1109/ACSSC.2009.5470160